ABCD3T X-Ray irradiation page

Test results of the QA X-Ray irradiations of the ABCD3T chips (readout ASIC for ATLAS SCT). 


 
  page under construction...

 



QA X-Ray irradiation for production runs    

Total dose        -        10MRad.

Dose rate         -         36.6kRad/min.

Data presented with no annealing. 

Digital and analogue current consumptions measured at Vcc=3.5V and Vdd=4.5V. 

X-RAY RUN: November 2001

Lots: Z39992, Z39992B, Z39993, Z39993B

RESULTS: 

 

QA X-Ray irradiation for production runs - starting from 15.01.2002 

slightly modified conditions  for irradiations 

Total dose        -        10MRad.

Dose rate         -         36.6kRad/min.

Data in excel file (digital tests and power consumptions) after irradiation presented with no annealing

Digital and analogue current consumptions measured at Vcc=3.5V and Vdd=4.0V.

Temperature (controlled) during irradiation: +29 ±1șC

 

X-RAY RUN: January 2002

Lots: Z39693, Z40616, Z40800, Z40801, Z40859

RESULTS:

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: March 2002

Lots: Z40603, Z40802, Z40803, Z40920, Z41032

RESULTS:

 

BAD CALIBRATION OF X-RAY MACHINE  - RESULTS NOT VALID

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: May 2002

Lots: Z40918, Z40916, Z41037

RESULTS:

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: May/June 2002

Lots: Z40918, Z40916, Z41037

RESULTS:

 

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: September 2002

Lots: Z41084, Z41087, Z41088, Z41125, Z41183

RESULTS:

 

 

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: October 2002

Lots: Z40919, Z40973, Z40974, Z41038, Z41083, Z41085, Z41089

RESULTS:

 

 

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: March 2003

Lots: Z41036, Z41086, Z41124, Z43161, Z43382

RESULTS:

 

 

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: July 2003

Lots: Z43384, Z43644, Z43645, Z43647, Z44036, Z44038, Z44039

RESULTS:

 

 

 

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: September 2003

Lots: Z43160, Z43280, Z43281, Z43283, Z43383, Z43385, Z43646

RESULTS:

 

 

 

 

Ambient temperature during irradiation: +30 to +40șC

X-RAY RUN: September 2004

Lots: Z37553

RESULTS:

 



Summary results for QA X-Ray irradiation   

The excess current is measured immediately after irradiation without annealing. The value of the excess current has been normalized for the same 4V power supply (earlier tests have been done for 4.5V Vdd). The correction factor is around 0.7 for conversion from 4.5 to 4V Vdd.  The measurements have been done at ambient (~40° C) temperature. 

 

Histogram of excess current measured after 10MRad X-Ray irradiation for pre-production and production batches.

 

 

Evolution of excess current problem for consecutive production lots. 

 



X-Ray irradiation of the single ABCD3T chips (comparison with PS module/hybrid irradiation)

Total dose        -        10MRad.

Dose rate         -         36.6kRad/min.

Results of the digital tests after 10 MRad  presented with no annealing. 

Digital and analogue current consumptions measured at Vcc=3.5V and Vdd=4.5V (if not specified). 

Results:

Results summary: (pdf file). 

Minimum biasing scheme for ABCD3T to configure chip in MASTER mode: (pdf file).

 




Info on BIN files for ABCD3T lots was moved to this location





Site Created on Thursday, 30 November 2000. Last modified by Jan Kaplon on 09/09/2004