Evolutions of digital power consumption during QA X-Ray irradiations
X-RAY irradiation - September 2003
Annealing of excess current for various periods of time (usually very short due to limited access to X-Ray machine) for different chips has been shown. Temperature during that annealing was the ambient temperature (30-40°C) .
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Raw data for power consumption evolution: tar.file
EPS figures with power consumption evolution: tar. file
Site Created on Thursday, 30 November 2000. Last modified by Jan Kaplon on 10/08/2003