Evolutions of digital power consumption during QA X-Ray irradiations

X-RAY irradiation - September 2003

Annealing of excess current for various periods of time (usually very short due to limited access to X-Ray machine)  for different chips has been shown. Temperature during that annealing was the ambient temperature (30-40°C) .


 

Raw data for power consumption evolution: tar.file

EPS figures with power consumption evolution: tar. file



Site Created on Thursday, 30 November 2000. Last modified by Jan Kaplon on 10/08/2003