Evolutions of digital power consumption during QA X-Ray irradiations

X-RAY irradiation - March 2002

Annealing of excess current for various periods of time (usually very short due to limited access to X-Ray machine)  for different chips has been shown. Temperature during that annealing was the ambient temperature (30-40°C) .


System crash after 150min of irradiation. 

Problem with one digital test at 50MHz. 

From that particular wafer two chips have been tested. 

Raw data from the measurements of current consumption for analogue and digital part of the chip in MASTER and SLAVE mode can be found here (TAR file).



Site Created on Thursday, 30 November 2000. Last modified by Jan Kaplon on 03/22/2002