Evolutions of digital power consumption during QA X-Ray irradiations
X-RAY irradiation - January 2002
Annealing of excess current for various periods of time (usually very short due to limited access to X-Ray machine) for different chips has been shown. Temperature during that annealing was the same as for irradiation (+29 ±1șC).
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Raw data from the measurements of current consumption for analogue and digital part of the chip in MASTER and SLAVE mode can be found here (TAR file).
Site Created on Thursday, 30 November 2000. Last modified by Jan Kaplon on 02/10/2002